Huntron_HTR-1005B1S-Operator 电路图.pdf

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1、OPERATORMANUAL , , FOR MODELS HTR 1005B18 . HTR 1005B1E8 HTR 1005B1J8 HUNTRON INSTRUMENTS. INC.15123Hwy.99North.Lynnwood. WA98037.(800)426-9265 (206)743-3171 Telex152951 RadioFans.CN 收音机爱 好者资料库 RadioFans.CN 收音机爱 好者资料库 TABLE OF CONTENTS SECTION 1 - GENERAL INFORMATION 1.1ABOUT THIS MANUAL 1.2 TRACKER

2、 DESCRIPTION,1-1 1.3 PRINCIPLESOFTRACKER OPERATION,1-3 1.3,1 Tracker Test Signal,1-3 1.3.2 Horizontal and Vertical Deflection ofthe Display,1-3 1.3.3 Short and Open Circuit Displays.,1-4 SECTION 2 - TRACKER OPERATION 2.1 GENERAL, ,2-1 2.2 CONTROLS AND INDICATORS,.,.,2-1 2.3 ALTERNATE MODE OPERATION,

3、2-3 2.4FUSE REPLACEMENT,2-3 SECTION 3 - TESTING DIODES 3.1THESEMICONDUCTOR DIODE AND ITS CHARACTERISTICS3-1 3.1.1 Diode Symbol and Definition.,3-1 3.1.2 The Volt-Ampere Characteristic,3-2 3.2 SILICON RECTIFIERDIODES.,3-2 3.2.1 Patternsofa Good Diode3-2 3.2.2 PatternsofaDefective Diode,3-3 3.3HIGHVOL

4、TAGE SILICON DIODES,3-3 3.4RECTIFIER BRIDGES,3-5 3.5 LIGHT-EMITTING DIODES3-8 3.6ZENER DIODES3-8 SECTION 4 - TESTING TRANSISTORS 4.1 BIPOLAR JUNCTION TRANSISTORS, , , , ,4-1 4,2 NPN BIPOLAR TRANSISTORS,.,.,4-1 4,2.1 B-E Junction Testing,.,4-2 4.2.2C-E Connection Testing,4-2 4.2.3C-B Junction Testing

5、,.,4-3 4.3PNPBIPOLAR TRANSISTORS,4-4 4.4POWER TRANSISTORS - NPN OR PNP4-5 4.5 DARLINGTON TRANSISTORS.,.,.,.,4-5 4.6JFET TRANSISTORS,4-8 4.7 MOSFET TRANSISTORS, , , , , . , , , . ,4-9 4.7. I General,4-9 4.7.2Depletion Mode MOSFET,.4-10 4.7.3Enhancement Mode MOSFET4-11 4.7.4MOSFET with Protection Diod

6、e4-12 4.8UNIJUNCTION TRANSISTORS (UJT)4-15 SECTION 5 - RESISTORS, CAPACITORS, AND INDUCTORS 5.1 RESISTORS5-1 5.1.1General5-1 5.1.2 Low Range5-1 5.1.3 Medium Range5-2 5.1.4High Range,.5-2 5.2 CAPACITORS5-3 5.3 INDUCTORS,5-3 5.4TOROID INDUCTORS,5-6 RadioFans.CN 收音机爱 好者资料库 SECTION 6 - TESTING MULTIPLE

7、COMPONENT CIRCUITS 6.1 TRACKER DIAGNOSTIC PRINCIPLES6-1 6.2DIODE/RESISTOR CIRCUIT6-2 6.2.1 Diode in Parallel with Resistor6-2 6.2.2 Diode in Series with Resistor6-4 6.3 DIODE AND CAPACITOR PARALLEL COMBINATION6-5 6.4RESISTOR AND CAPACITOR PARALLEL COMBINATION6-7 6.5 INDUCTOR WITH DIODE6-8 SECTION 7

8、- TESTING INTEGRATED CIRCUITS 7.1 INTRODUCTION7-1 7.1.1 Integrated Circuit Technology7-1 7.1.2 Integrated Circuit Testing Techniques7-2 7.2 LINEAR OPERATIONAL AMPLIFIERS7-2 7.3 LINEAR VOLTAGE REGULATORS_7-5 7.3.1 The 7805 Regulator7-5 7.3.2 The 7905 Regulator7-7 7.4555 TIMERS7-9 7.5 TTL DIGITAL INTE

9、GRATED CIRCUITS7-12 7.5.1 General7-12 7.5.2 TTL Devices7-13 7.5.3LSTTL Devices7-14 7.5.4Tri-StateTTLDigital Devices7-15 7.6CMOS INTEGRATED CIRCITS7-17 7.7 MICROPROCESSORS7-19 SEC1ION8 - TESTING RECTIFIERS 8.1 SILICON CONTROLLED RECTIFIERS8-1 8.2 TRIAC DEVICES8-3 SECTION 9 - TESTING POWER SUPPLIES 9.

10、1 GENERAL9-1 9.2TESTING PROCEDURE9-2 SECTION 10 - TESTING COMPONENTS BY COMPARISON 10.1 INTRODUCTION10-1 10.2 SETUP PROCEDURES10-1 10.3 HIGH VOLTAGE TRANSISTOR (TIP-50)_10-2 10.3.1 TIP-50 B-E Junction10-2 10.3.2 TIP-50 C-E Junction10-3 10.4 HIGH VOLTAGE DIODE HV-15F10-4 10.5lOOuF25V ELECTROLYTIC CAP

11、ACITOR10-4 10.61458 DUAL OP-AMP10-5 10.77905 NEGATIVE REGULATOR10-8 SECTION11- SOLVING BUS PROBLEMS 11.1 INTRODUCTION11-1 11.2 STUCK WIRED-OR BUS11-1 11.3 DEFECTIVE WAVESHAPE ON BUS11-1 11.4 MEMORIES11-1 SECTION 12 - TROUBLESHOOTING TIPS APPENDIX AAI APPENDIX BAS ii 1.1ABOUTTHISMANUAL This manualisp

12、rovided for the operatorofthe Huntron Tracker. The information contained within this manual familiarizes the reader first with the tracker and its principles ofoperation. and then with its specific uses. A working knowledgeofthe trackers operating principles greatly assists the userinevaluating the

13、trackers display. especially when using the instrument for troubleshooting purposes. The manualisdivided into sections. Each section contains information pertinent to a certain applicationofthe unit. The sections contain the following information. Section I - GENERAL INFORMATION This section provide

14、s a descriptionofthe tracker and lists its specifications.Italso describes the principles on which the tracker operates. using a pure resistance and a diode as examples. Section 2 - TRACKER OPERATION This section describes the front panel controlsofthe tracker.Italso describes the trackers comparati

15、ve testing feature. Section 3 - DIODE TESTING This section describes the characteristicsofthe diode (showingitsvoltage-to-current relationship). whichis essential to understanding the tracker display. This section also illustrates and describes tracker displays produced when the test leads are conne

16、cted to (or across) circuits containing the following devices: sili- con diodes. high voltage silicon diodes, zener diodes, bridging diodes. and light-emitting diodes. Section 4 -TRANSISffiRTESTING This section illustrates and describes tracker displays produced when the test leads are connected to

17、(or SECTION 1 GENERAL INFORMATION across) circuits containing the following devices: NPN andPNPtransistors, Darlington pairs, germanium transistors,MOSFETs,J-FETs,and unijunction transistors. Section 5 - PASSIVE COMPONENTS This section describes and illustrates tracker displays produced when the tes

18、t leads are connected to capaci- tive, inductive, and resitive circuitsordevices. Section 6 - TESTING MULTIPLE COMPONENT CIR- CUITS This section covers the testingofdiode/resistor combi- nations. diode/capacitor combinations. and capacitor- /resistor combinations. Section 7 - TESTING INTEGRATED CIRC

19、UITS This section discusses integrated circuit technology followedbytesting information for linear devices such as operational amplifiers and voltage regulators. Test- ing informationisalso provided for the LM555 Timer aswellas TTL. LS TTL, and CMOS devices. Section 8 - TESTING RECTIFIERS This secti

20、on describes the testingofsilicon-controlled rectifiers and TRIAC devices. Section 9 - TESTING POWER SUPPLIES This describes how to use the trackertotest the typical transformer/full-wave bridge typepower supply. Section10-TESTING COMPONENTSBYCOMPARISON This section provides tracker displays for def

21、ective components as compared to known good devices. The trackerisused in the alternate mode to check a high voltage transistor. a high voltage diode, an electrolytic capacitor, an op-amp, and a regulator. 1-1 SECfION11- SOLVING BUS PROBLEMS This section contains information that may be helpful when

22、 attempting to isolate faults causedbydefective devices connected to a common bus. SECfION12- TROUBLESHOOTING TIPS This section contains a seriesoftroubleshooting sug- gestions and information that should assist the user when using the tracker. Table I-I. Specifications TEST SIGNALDATA Waveform Type

23、sinusoidal Frequency80Hz Voltage/Current Characteristics - Low Range Open Circuit Voltage (peak-to-peak)20 Short Circuit Current (mA rms)64 Power (mW rms)81 Power (mW peak)161 Short Circuit Current (mA peak)170 Voltage/Current Characteristics - Medium Range Open Circuit Voltage (peak-to-peak)40 Shor

24、t Circuit Current (mA rms)0.27 Power (mW rms)0.23 Power (mW peak)0.45 Short Circuit Current (mA peak)0.7 Voltage/Current Characteristics - High Range Open Circuit Voltage (peak-to-peak)120 Short Circuit Current (mA rms)0.29 Power (mW rms)0.26 Power (mW peak)0.52 Short Circuit Current (mA peak)0.8 NO

25、TE: All power ratings are conditions existing across a single silicon diode in the test terminalsofthe tracker. CRT SCREEN SIZE7cm diagonal CRT ACCELERATION POTENTIAL1350Yregulated INPUT PROTECTION Protection provided against damage causedbytouching probestoline voltages. TRACE ALTERNATE MODE Altern

26、ates display between channel A and B inputs at o.8Hz rate POWER REQUIREMENTS HTR l005B-IS117V,60Hz HTRl005B-1ES 220/240V, SO/60Hz HTR l005B-IJSIOOY,50/60Hz WEIGHT5 pounds, 5 ounces (2.4 kg) DIMENSIONS (inches)8-3/4WX3-1/2HX11-1/2D (21.9 em x 7.4emx24.2cm) AMBIENT TEMPERATURE Operating.zero to + 50 d

27、egrees Celsius Storage-50 to+60degrees Celsius SHOCK AND VIBRATION Will withstand shock and vibration encounteredincommerical shipping and handling 12 1.2 TRACKER DESCRIPTION The tracker is a general purpose troubleshooting test instru- ment. It qualitatively evaluates digital, analog, and hybrid se

28、miconductor devices, as well as capacitive and inductive devices, in or out ofcircuit,ina power off state. The tracker operatesbyproviding an ac stimulus to the component or circuit under test and displaying the resultant current and voltage levels and their phase relationship. The tracker dis- play

29、 indicates any component leakage, shorts, opens, noise, plus any combination of these problems. TableI-Ilists the specifications ofthe tracker. Included with each tracker is a setofHuntron Micro Probe test leads. These test leads plug into the front panel testjacks ofthe tracker and have special tip

30、s that allow contact with very small component terminals and printed circuit board traces without the dangeroftouching adjacent component leads and terminals. Also included with the tracker is a special common test lead that allows the connection oftracker common to two compo- nents. This test leadi

31、susedinthe alternate modeofopera- tion. 1.3 PRINCIPLES OF TRACKER OPERATION 1.3.1 Tracker Test Signal The tracker applies an 80Hz sinewave test signal across two terminals (or nodes) of a device to be tested. The test signal ZiEN GEN +25_ V20V COM RANGE-MEDIUM TEST-OPENCIRCUIT causes current to flow

32、 through the device and a voltage drop to appear acrossit.The current flow through the device causes vertical deflectionofthe tracker display while the voltage drop across the device causes horizontal deflectionof the tracker display. The test signal is selected for application to adeviceorcircuit u

33、nder testinoneofthree available ranges;low,medium, and high. The open-circuit voltage values for each range are listedinTable1-1.Note that current-limitingisprovided on each range for complete protectionofthe deviceorcircuit under test. 1.3.2 Horizonal and Vertical Deflection oftheDisplay The test s

34、ignal outputofthe tracker causes current flow through the device under test and a voltage drop across it. Vertical deflection above the center lineofthe graticule indicates the amountofcurrent flow when the test signal is on a positive half-cycle. Vertical deflection belowthe centerline indicates th

35、e amountofcurrent flow when the test signal is on the negative half-cycle. The voltage drop across the device causes horizontal deflec- tionofthe tracker display; the greater the voltage drop, the greater the deflection on the display. Horizontal deflectionto the rightofthe center line indicates the

36、 amountofvoltage drop when the test signal is on a negative half-cycle. Hori- zontal deflectiontothe left of the center line indicates the amount of voltage drop when the test signal is on the positive half-cycle. FigureI-I.Electrical Equivalentofthe Test Signal Generator 1-3 FigureI-Ishows the elec

37、trical equivalentofthe test signal generator within the tracker andhowthe current through and voltage drop across the test terminals provide vertical and horizontal deflectionofthe display. The 80Hz test signal is providedbythe signal generator anditsseries impedance (Zgen).Allcurrent that passes th

38、rough the test terminals to the device under test, also passes through a current sensing point (I). The vertical deflection plates receive deflection voltage from this current sensing point. The amountof deflection voltage provided to the vertical deflection plates is proportional to the amountofcur

39、rent flowing through the device under test. The voltage appearing across the test terminals (and the device undertest)isalso applied across the horizontal deflec- tion plates. The amountofvoltage provided to the horizontal deflection plates is proportional to the voltage drop across the device under

40、 test. 1.3.3 Short and Open Circuit Displays An open circuit, such as the test ieads unconnected, causes zero current flow through and maximum voltage drop across the test terminals. This condition causes the displays shown inFigure1-2for the three operating ranges.Inthe high and medium ranges the z

41、ero current and maximum voltageis representedbya straight horizontal trace from the far leftto the far right of the display.Inthe low range, the trackeris designed to produce a diagonal trace for an open circuit condition. A short circuit (e.g., the test leads shorted together) causes maximum curren

42、tflowthrough and zero voltage drop across the test terminals. This condition causes the displays shown inFigure1-3for the three operating ranges.Inall ranges the zero voltage and maximum currentisrepresentedbya straight vertical trace from the top to the bottomofthe display. 1-4 LOWMEDIUM Figure 1-2

43、.OpenCircuit Displays Figure 1-3. Short Circuit Display for all Ranges HIGH ) T CLOCKWISEROTATION 33K A COM GEN +2 V+- SIGNAC20- SOURCE 320JAQ PEAK RANGE:MEDIUM TEST:33KRESISTOR Figure 1-4. Pure Resistance Display A pure resistance connected across the test leads would cause both current flow and vo

44、ltage drop, resultingina deflected straight trace on the tracker display. On the high and medium ranges, the trace would be deflected clockwise around the centerofthe display from the horizontal (open circuit) posi- tion, while on the low range it would be deflected clockwise from the open circuit d

45、iagonal position. Onallranges, the lengthofthe traceisreduced due tothe internal impedanceof (Zgen) the test signal generator. The amount of trace reduc- tion and rotation depends on the test resistance value and the range chosen for the test. Figure1-4shows the typical effect ofresistance on the tr

46、acker display. Figure 1-5. Traceofa Silicon Diode, Medium/High Range I -.-(-.v Figure 1-6. Voltage-to-Current Characteristic ofaDiode NON-CONDUCTION REVERSEBIAS CONDUCTION FORWARDBIAS Since a pure resistanceiselectrically linear, the resulting trace will alwaysbea straight line. However, non-linear

47、electrical devices do not produce a straight line over the entire lengthofthe trace. A non-linear component such as a silicon diode allows a large amountofcurrent to flow during the halfcycleofthe test signal when itisforward-biased, and only a minute amountofcurrent to flow during the halfcycle whe

48、nitisreverse-biased. The voltage drop across the diode junctionissmall when forward-biased (short circuit), and near maximum when reversed biased (open circuit). Figure 1-5shows the trace producedbythe tracker when connected across a silicon diode. Figure1-6shows the typical voltage- to-current char

49、actersticofthe same diode, Note that the trace producedbythe trackerisa near mirror-imageofthe voltage- to-current characteristic. 15 1-6 NOTES: SECTION 2 TRACKER OPERATION 2.1GENERAL Components are testedbythe tracker using a two terminal system, where twotest leads are placed across the component under test. All testingisperformed under power-off condi- tions for the component/equipment under test. The tracker tests components while in-circuit, even when bridgedby other components. Included with each trackerisa set of Huntron